We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.

叙述了次条纹积分计量的原理，仅用一幅光载条纹图获取全部相信息。

It has been proved that this method is fit for the parallel linable fringes and the interferograms with the arbitrary closed loop fringe pattern.

该方法具有高、抗扰的特点，不仅适用于平行直线型条纹图像，而且对含闭合条纹的复杂图像同样适用。